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Comparison of MCCAD and DAGMC for Predictive Capability with BGA Inspection Systems

Michael P. Pfeifer, Nathanael Simerl (Kansas State), John Porter (Honeywell), Walter J. McNeil, Amir A. Bahadori (Kansas State)

Transactions / Volume 120 / Number 1 / June 2019 / Pages 767-770

 
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