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Volume 135

Number 1

Analysis of Differences in Void Coefficient Predictions for Mixed-Oxide-Fueled Tight-Pitch Light Water Reactor Cells

Hironobu Unesaki, Seiji Shiroya, Keiji Kanda, Stéphane Cathalau, Franck-Olivier Carré, Otohiko Aizawa, Toshikazu Takeda

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 1-22

Technical Paper

Measurement of Activation Reaction Rate Distributions in a Lead Assembly Bombarded with 500-MeV Protons

Hiroshi Takada, Shin-ichro Meigo, Toshinobu Sasa, Kazufumi Tsujimoto, Hideshi Yasuda

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 23-32

Technical Paper

Epithermal Inverse Kinetic Measurements and Their Interpretation Using a Two-Group Point-Kinetic Model

Marc Rosselet, Rakesh Chawla, Tony Williams

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 33-47

Technical Paper

Influence of the Thermal Cutoff Energy on the Calculation of Neutronic Parameters for Light Water Reactor Lattices

Jean-Marie Paratte, Sandro Pelloni

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 48-56

Technical Paper

Properties of a Cold-Neutron Irradiation Facility for In Vitro Research on Boron Neutron Capture Therapy at the Geesthacht Neutron Facility

L. Lüdemann, R. Kampmann, W. Sosaat, P. Staron, P. Wille

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 57-63

Technical Paper

Verification of the Neutron Flux of a Modified Zero-Power Reactor Using a Neutron Activation Method

Lung Kwang Pan, Cheng Si Tsao

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 64-72

Technical Paper

A Multigroup Albedo Method for Transport Calculations: Application to the Orphée Core

S. Rauck, R. Sanchez, I. Zmijarevic, M. Nobile

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 73-83

Technical Paper

Nuclide Importance and the Steady-State Burnup Equation

Hiroshi Sekimoto, Atsushi Nemoto

Nuclear Science and Engineering / Volume 135 / Number 1 / May 2000 / Pages 84-102

Technical Paper

 
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